Surface Scratch Imaging" Array-Compatible Small Eddy Current Flaw Detector "μS₂G₂
Surface scratches can now be visualized! Anyone can easily and quickly perform C-scan inspection! Inspection results are stored as digital data.
The array-compatible compact eddy current flaw detector "μS2G2" allows anyone to easily and quickly perform C-scan inspections, enabling the visualization of defects that were previously impossible to capture. 【Features】 The device is compact and lightweight (under 2 kg). By holding a tablet in one hand and a probe in the other, inspections can be conducted by a single operator. The tablet and device are connected via Wi-Fi. Power is supplied by a battery, and only the cable between the device and the probe is needed, making operations very simple. - Robust housing design: The device is dustproof and waterproof, having passed a 1-meter drop test. - Customization Probes and devices can be customized to meet specific requirements. Custom support is available. - Board (circuit board) supply Boards can be provided. They can be utilized as OEMs or integrated into crawlers and robots.
- Company:ディービー 本社、東京
- Price:Other